| |
| 2006 | ||
|---|---|---|
| 1 | EE | N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006) |
| 1 | J. Adrian | [1] |
| 2 | C. Grosjean | [1] |
| 3 | G. Haller | [1] |
| 4 | A. Portavoce | [1] |
| 5 | N. Rodriguez | [1] |