C. Grosjean

2006
2	EE	N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006)
2003
1	EE	Paul-Henri Albarède, S. Lavagne, C. Grosjean: Strain investigation around shallow trench isolations : a LACBED Study. Microelectronics Reliability 43(9-11): 1693-1698 (2003)

Coauthor Index

1	J. Adrian	[2]
2	Paul-Henri Albarède	[1]
3	C. Girardeaux	[2]
4	G. Haller	[2]
5	S. Lavagne	[1]
6	A. Portavoce	[2]
7	N. Rodriguez	[2]

Colors in the list of coauthors