| 2006 |
|---|
| 6 | EE | M. Heer,
V. Dubec,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2005 |
|---|
| 5 | EE | M. Heer,
V. Dubec,
M. Blaho,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Denison,
M. Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 |
|---|
| 4 | EE | V. Dubec,
Scrgey Bychikhin,
M. Blaho,
Dionyz Pogany,
E. Gornik,
J. Willemen,
N. Qu,
Wolfgang Wilkening,
L. Zullino,
A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectronics Reliability 43(9-11): 1557-1561 (2003) |
| 2002 |
|---|
| 3 | EE | Dionyz Pogany,
J. Kuzmik,
J. Darmo,
Martin Litzenberger,
Scrgey Bychikhin,
K. Unterrainer,
Z. Mozolova,
S. Hascik,
Tibor Lalinsky,
E. Gornik:
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectronics Reliability 42(9-11): 1673-1677 (2002) |
| 2001 |
|---|
| 2 | | Martin Litzenberger,
R. Pichler,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
K. Esmark,
Harald Gossner:
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectronics Reliability 41(9-10): 1385-1390 (2001) |
| 1 | | Scrgey Bychikhin,
Martin Litzenberger,
R. Pichler,
Dionyz Pogany,
E. Gornik,
G. Groos,
M. Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectronics Reliability 41(9-10): 1501-1506 (2001) |
