| 2005 |
|---|
| 4 | EE | M. Heer,
V. Dubec,
M. Blaho,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Denison,
M. Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 |
|---|
| 3 | EE | M. Blaho,
Dionyz Pogany,
E. Gornik,
M. Denison,
G. Groos,
M. Stecher:
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectronics Reliability 43(4): 545-548 (2003) |
| 2001 |
|---|
| 2 | EE | Harald Gossner,
T. Müller-Lynch,
K. Esmark,
M. Stecher:
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.
Microelectronics Reliability 41(3): 385-393 (2001) |
| 1 | | Scrgey Bychikhin,
Martin Litzenberger,
R. Pichler,
Dionyz Pogany,
E. Gornik,
G. Groos,
M. Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectronics Reliability 41(9-10): 1501-1506 (2001) |
