| 2007 |
|---|
| 5 | EE | Christoph Posch,
Michael Hofstatter,
Martin Litzenberger,
Daniel Matolin,
N. Donath,
P. Schon,
H. Garn:
Wide dynamic range, high-speed machine vision with a 2×256 pixel temporal contrast vision sensor.
ISCAS 2007: 1196-1199 |
| 2002 |
|---|
| 4 | EE | Wolfgang Stadler,
K. Esmark,
Harald Gossner,
M. Streibl,
M. Wendel,
Wolfgang Fichtner,
Dionyz Pogany,
Martin Litzenberger,
E. Gornik:
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectronics Reliability 42(9-11): 1267-1274 (2002) |
| 3 | EE | Dionyz Pogany,
J. Kuzmik,
J. Darmo,
Martin Litzenberger,
Scrgey Bychikhin,
K. Unterrainer,
Z. Mozolova,
S. Hascik,
Tibor Lalinsky,
E. Gornik:
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectronics Reliability 42(9-11): 1673-1677 (2002) |
| 2001 |
|---|
| 2 | | Martin Litzenberger,
R. Pichler,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
K. Esmark,
Harald Gossner:
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectronics Reliability 41(9-10): 1385-1390 (2001) |
| 1 | | Scrgey Bychikhin,
Martin Litzenberger,
R. Pichler,
Dionyz Pogany,
E. Gornik,
G. Groos,
M. Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectronics Reliability 41(9-10): 1501-1506 (2001) |
