| 2006 |
|---|
| 3 | EE | M. Heer,
V. Dubec,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2 | EE | Detlef Bonfert,
Horst A. Gieser,
Heinrich Wolf,
M. Frank,
A. Konrad,
J. Schulz:
Transient-induced latch-up test setup for wafer-level and package-level.
Microelectronics Reliability 46(9-11): 1629-1633 (2006) |
| 2004 |
|---|
| 1 | EE | A. K. Ziarani,
A. Konrad:
A method of extraction of nonstationary sinusoids.
Signal Processing 84(8): 1323-1346 (2004) |
