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A. Konrad

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2006
3EEM. Heer, V. Dubec, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Frank, A. Konrad, J. Schulz: Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. Microelectronics Reliability 46(9-11): 1591-1596 (2006)
2EEDetlef Bonfert, Horst A. Gieser, Heinrich Wolf, M. Frank, A. Konrad, J. Schulz: Transient-induced latch-up test setup for wafer-level and package-level. Microelectronics Reliability 46(9-11): 1629-1633 (2006)
2004
1EEA. K. Ziarani, A. Konrad: A method of extraction of nonstationary sinusoids. Signal Processing 84(8): 1323-1346 (2004)

Coauthor Index

1Detlef Bonfert [2]
2Scrgey Bychikhin [3]
3V. Dubec [3]
4M. Frank [2] [3]
5Horst A. Gieser [2]
6E. Gornik [3]
7M. Heer [3]
8Dionyz Pogany [3]
9J. Schulz [2] [3]
10Heinrich Wolf [2]
11A. K. Ziarani [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)