| 2006 |
|---|
| 5 | EE | M. Etherton,
N. Qu,
J. Willemen,
Wolfgang Wilkening,
S. Mettler,
M. Dissegna,
R. Stella,
L. Zullino,
A. Andreini,
Horst A. Gieser:
Study of CDM specific effects for a smart power input protection structure.
Microelectronics Reliability 46(5-6): 666-676 (2006) |
| 2005 |
|---|
| 4 | EE | Wolfgang Stadler,
K. Esmark,
K. Reynders,
M. Zubeidat,
M. Graf,
Wolfgang Wilkening,
J. Willemen,
N. Qu,
S. Mettler,
M. Etherton:
Test circuits for fast and reliable assessment of CDM robustness of I/O stages.
Microelectronics Reliability 45(2): 269-277 (2005) |
| 3 | EE | Heinrich Wolf,
Horst A. Gieser,
Wolfgang Stadler,
Wolfgang Wilkening:
Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain.
Microelectronics Reliability 45(2): 279-285 (2005) |
| 2003 |
|---|
| 2 | EE | V. Dubec,
Scrgey Bychikhin,
M. Blaho,
Dionyz Pogany,
E. Gornik,
J. Willemen,
N. Qu,
Wolfgang Wilkening,
L. Zullino,
A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectronics Reliability 43(9-11): 1557-1561 (2003) |
| 2001 |
|---|
| 1 | EE | Michael Schenkel,
Paul Pfäffli,
Wolfgang Wilkening,
D. Aemmer,
Wolfgang Fichtner:
Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation.
Microelectronics Reliability 41(6): 815-822 (2001) |
