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M. Blaho

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2005
4EEM. Heer, V. Dubec, M. Blaho, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005)
2003
3EEM. Blaho, Dionyz Pogany, E. Gornik, M. Denison, G. Groos, M. Stecher: Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability 43(4): 545-548 (2003)
2EEV. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini: A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability 43(9-11): 1557-1561 (2003)
2002
1EEM. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, E. Gornik: Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. Microelectronics Reliability 42(9-11): 1281-1286 (2002)

Coauthor Index

1A. Andreini [1] [2]
2Scrgey Bychikhin [2] [4]
3M. Denison [3] [4]
4V. Dubec [2] [4]
5E. Gornik [1] [2] [3] [4]
6G. Groos [3] [4]
7M. Heer [4]
8Dionyz Pogany [1] [2] [3] [4]
9N. Qu [2]
10M. Stecher [3] [4]
11Wolfgang Wilkening [2]
12J. Willemen [2]
13L. Zullino [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)