| 2005 |
|---|
| 4 | EE | M. Heer,
V. Dubec,
M. Blaho,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Denison,
M. Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 |
|---|
| 3 | EE | M. Blaho,
Dionyz Pogany,
E. Gornik,
M. Denison,
G. Groos,
M. Stecher:
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectronics Reliability 43(4): 545-548 (2003) |
| 2 | EE | V. Dubec,
Scrgey Bychikhin,
M. Blaho,
Dionyz Pogany,
E. Gornik,
J. Willemen,
N. Qu,
Wolfgang Wilkening,
L. Zullino,
A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectronics Reliability 43(9-11): 1557-1561 (2003) |
| 2002 |
|---|
| 1 | EE | M. Blaho,
Dionyz Pogany,
L. Zullino,
A. Andreini,
E. Gornik:
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions.
Microelectronics Reliability 42(9-11): 1281-1286 (2002) |
