| |
| 2005 | ||
|---|---|---|
| 2 | EE | M. Heer, V. Dubec, M. Blaho, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos: Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 | ||
| 1 | EE | M. Blaho, Dionyz Pogany, E. Gornik, M. Denison, G. Groos, M. Stecher: Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability 43(4): 545-548 (2003) |
| 1 | M. Blaho | [1] [2] |
| 2 | Scrgey Bychikhin | [2] |
| 3 | V. Dubec | [2] |
| 4 | E. Gornik | [1] [2] |
| 5 | G. Groos | [1] [2] |
| 6 | M. Heer | [2] |
| 7 | Dionyz Pogany | [1] [2] |
| 8 | M. Stecher | [1] [2] |