2002 | ||
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1 | EE | Dionyz Pogany, J. Kuzmik, J. Darmo, Martin Litzenberger, Scrgey Bychikhin, K. Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, E. Gornik: Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectronics Reliability 42(9-11): 1673-1677 (2002) |
1 | Scrgey Bychikhin | [1] |
2 | E. Gornik | [1] |
3 | S. Hascik | [1] |
4 | J. Kuzmik | [1] |
5 | Tibor Lalinsky | [1] |
6 | Martin Litzenberger | [1] |
7 | Z. Mozolova | [1] |
8 | Dionyz Pogany | [1] |
9 | K. Unterrainer | [1] |