| 2006 |
|---|
| 3 | EE | M. Heer,
V. Dubec,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2005 |
|---|
| 2 | EE | M. Heer,
V. Dubec,
M. Blaho,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Denison,
M. Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
| 2003 |
|---|
| 1 | EE | V. Dubec,
Scrgey Bychikhin,
M. Blaho,
Dionyz Pogany,
E. Gornik,
J. Willemen,
N. Qu,
Wolfgang Wilkening,
L. Zullino,
A. Andreini:
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectronics Reliability 43(9-11): 1557-1561 (2003) |
