| 2006 |
|---|
| 2 | EE | M. Heer,
V. Dubec,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Frank,
A. Konrad,
J. Schulz:
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectronics Reliability 46(9-11): 1591-1596 (2006) |
| 2005 |
|---|
| 1 | EE | M. Heer,
V. Dubec,
M. Blaho,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
M. Denison,
M. Stecher,
G. Groos:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectronics Reliability 45(9-11): 1688-1693 (2005) |
