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A. Andreini

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2006
4EEM. Etherton, N. Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, M. Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser: Study of CDM specific effects for a smart power input protection structure. Microelectronics Reliability 46(5-6): 666-676 (2006)
2003
3EEA. Andreini, C. Neva, L. Renard, G. Sironi, F. Speroni, L. Sponton, F. Tampellini, R. Tiziani: Pad Over Active (POA) solutions for three metal level BCD5 mixed power process - Design and validation of ESD protections. Microelectronics Reliability 43(9-11): 1377-1382 (2003)
2EEV. Dubec, Scrgey Bychikhin, M. Blaho, Dionyz Pogany, E. Gornik, J. Willemen, N. Qu, Wolfgang Wilkening, L. Zullino, A. Andreini: A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. Microelectronics Reliability 43(9-11): 1557-1561 (2003)
2002
1EEM. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, E. Gornik: Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. Microelectronics Reliability 42(9-11): 1281-1286 (2002)

Coauthor Index

1M. Blaho [1] [2]
2Scrgey Bychikhin [2]
3M. Dissegna [4]
4V. Dubec [2]
5M. Etherton [4]
6Horst A. Gieser [4]
7E. Gornik [1] [2]
8S. Mettler [4]
9C. Neva [3]
10Dionyz Pogany [1] [2]
11N. Qu [2] [4]
12L. Renard [3]
13G. Sironi [3]
14F. Speroni [3]
15L. Sponton [3]
16R. Stella [4]
17F. Tampellini [3]
18R. Tiziani [3]
19Wolfgang Wilkening [2] [4]
20J. Willemen [2] [4]
21L. Zullino [1] [2] [4]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)