| 2001 |
|---|
| 2 | | Martin Litzenberger,
R. Pichler,
Scrgey Bychikhin,
Dionyz Pogany,
E. Gornik,
K. Esmark,
Harald Gossner:
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectronics Reliability 41(9-10): 1385-1390 (2001) |
| 1 | | Scrgey Bychikhin,
Martin Litzenberger,
R. Pichler,
Dionyz Pogany,
E. Gornik,
G. Groos,
M. Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectronics Reliability 41(9-10): 1501-1506 (2001) |
