| 2001 |
|---|
| 4 | | Bart Vermeulen,
Steven Oostdijk,
Frank Bouwman:
Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip.
ITC 2001: 121-130 |
| 1994 |
|---|
| 3 | | Frank Bouwman,
Taco Zwemstra,
Sonny Hartanto,
Keith Baker,
Jan Koopmans:
Application of Joint Time-Frequency Analysis in Mixed-Signal Testing.
ITC 1994: 747-756 |
| 1993 |
|---|
| 2 | | Hans Bouwmeester,
Steven Oostdijk,
Frank Bouwman,
Rudi Stans,
Loek Thijssen,
Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test.
ITC 1993: 451-460 |
| 1992 |
|---|
| 1 | | Frank Bouwman,
Steven Oostdijk,
Rudi Stans,
Ben Bennetts,
Frans P. M. Beenker:
Macro Testability: The Results of Production Device Applications.
ITC 1992: 232-241 |
