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| 1993 | ||
|---|---|---|
| 3 | R. Mehtani, B. Atzema, M. De Jonghe, Richard Morren, Geert Seuren, Taco Zwemstra: Mix Test: A Mixed-Signal Extension to a Digital Test System. ITC 1993: 945-953 | |
| 1992 | ||
| 2 | Bas Verhelst, Richard Morren, Keith Baker: Using EDIF for Transfer of Test Data: Practical Experience. ITC 1992: 459-465 | |
| 1 | R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker: Improving Total IC Design Quality Using Application Mode Testing. ITC 1992: 866-872 | |
| 1 | B. Atzema | [3] |
| 2 | Keith Baker | [1] [2] |
| 3 | M. De Jonghe | [1] [3] |
| 4 | R. Mehtani | [1] [3] |
| 5 | Geert Seuren | [3] |
| 6 | Bas Verhelst | [2] |
| 7 | Taco Zwemstra | [3] |