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2001 | ||
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2 | F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers: Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479 | |
1995 | ||
1 | Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen: Plug & Play IDDQ Monitoring with QTAG. ITC 1995: 739-749 |
1 | Keith Baker | [1] |
2 | Alex S. Biewenga | [2] |
3 | F. G. M. Bouwman | [1] |
4 | D. C. L. van Geest | [2] |
5 | F. G. M. de Jong | [2] |
6 | M. J. W. Verstraelen | [1] |