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| 2001 | ||
|---|---|---|
| 2 | F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers: Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479 | |
| 1995 | ||
| 1 | Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen: Plug & Play IDDQ Monitoring with QTAG. ITC 1995: 739-749 | |
| 1 | Keith Baker | [1] |
| 2 | Alex S. Biewenga | [2] |
| 3 | F. G. M. Bouwman | [1] |
| 4 | D. C. L. van Geest | [2] |
| 5 | F. G. M. de Jong | [2] |
| 6 | M. J. W. Verstraelen | [1] |