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| 1992 | ||
|---|---|---|
| 2 | Bas Verhelst, Richard Morren, Keith Baker: Using EDIF for Transfer of Test Data: Practical Experience. ITC 1992: 459-465 | |
| 1990 | ||
| 1 | EE | Bas Verhelst: Using a Test-Specification Format in Automatic Test-Program Generation. IEEE Design & Test of Computers 7(1): 39-45 (1990) |
| 1 | Keith Baker | [2] |
| 2 | Richard Morren | [2] |