2004 | ||
---|---|---|
2 | EE | Michael Spica, T. M. Mak: Do We Need Anything More Than Single Bit Error Correction (ECC)? MTDT 2004: 111-116 |
2002 | ||
1 | EE | Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu: IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. DELTA 2002: 403-407 |
1 | Ali Chehab | [1] |
2 | T. M. Mak | [2] |
3 | Rafic Z. Makki | [1] |
4 | David Wu | [1] |