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Swapnil Bahl

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2007
2EESwapnil Bahl: A Sharable Built-in Self-Repair for Semiconductor Memories with 2-D Redundancy Schema. DFT 2007: 331-339
2004
1EESwapnil Bahl: A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. MTDT 2004: 78-83

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)