2007 | ||
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2 | EE | Swapnil Bahl: A Sharable Built-in Self-Repair for Semiconductor Memories with 2-D Redundancy Schema. DFT 2007: 331-339 |
2004 | ||
1 | EE | Swapnil Bahl: A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. MTDT 2004: 78-83 |