Mike Purtell

2001
3		Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Testing for resistive opens and stuck opens. ITC 2001: 1049-1058
1998
2	EE	Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193
1	EE	Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey: Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125

Coauthor Index

1	Jonathan T.-Y. Chang	[1] [2]
2	Yi-Chin Chu	[1]
3	Chien-Mo James Li (James Chien-Mo Li)	[2] [3]
4	Edward J. McCluskey	[1] [2] [3]
5	Chao-Wen Tseng	[1] [2] [3]
6	Sanjay Wattal	[1]