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Yi-Chin Chu

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1998
2EEJonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey: Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125
1996
1 Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700

Coauthor Index

1Jonathan Chang [1]
2Jonathan T.-Y. Chang [2]
3William D. Farwell [1]
4Piero Franco [1]
5Siyad C. Ma [1]
6Edward J. McCluskey [1] [2]
7Mike Purtell [2]
8Robert L. Stokes [1]
9Chao-Wen Tseng [2]
10Sanjay Wattal [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)