Yi-Chin Chu

1998
2	EE	Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey: Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125
1996
1		Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700

Coauthor Index

1	Jonathan Chang	[1]
2	Jonathan T.-Y. Chang	[2]
3	William D. Farwell	[1]
4	Piero Franco	[1]
5	Siyad C. Ma	[1]
6	Edward J. McCluskey	[1] [2]
7	Mike Purtell	[2]
8	Robert L. Stokes	[1]
9	Chao-Wen Tseng	[2]
10	Sanjay Wattal	[1] [2]