| |
| 2001 | ||
|---|---|---|
| 2 | EE | Jie Wu, Patrick Juliano, Elyse Rosenbaum: Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectronics Reliability 41(11): 1771-1779 (2001) |
| 1 | EE | Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum: Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectronics Reliability 41(11): 1781-1787 (2001) |
| 1 | Sopan Joshi | [1] |
| 2 | Elyse Rosenbaum | [1] [2] |
| 3 | Yu Wang | [1] |
| 4 | Jie Wu | [2] |