| 2002 |
|---|
| 10 | EE | Pinhong Chen,
Yuji Kukimoto,
Chin-Chi Teng,
Kurt Keutzer:
On convergence of switching windows computation in presence of crosstalk noise.
ISPD 2002: 84-89 |
| 1998 |
|---|
| 9 | EE | Li-Pen Yuan,
Chin-Chi Teng,
Sung-Mo Kang:
Statistical estimation of average power dissipation using nonparametric techniques.
IEEE Trans. VLSI Syst. 6(1): 65-73 (1998) |
| 8 | EE | Yi-Kan Cheng,
Prasun Raha,
Chin-Chi Teng,
Elyse Rosenbaum,
Sung-Mo Kang:
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 668-681 (1998) |
| 1997 |
|---|
| 7 | EE | Li-Pen Yuan,
Chin-Chi Teng,
Sung-Mo Kang:
Statistical Estimation of Average Power Dissipation in Sequential Circuits.
DAC 1997: 377-382 |
| 6 | EE | Chin-Chi Teng,
Yi-Kan Cheng,
Elyse Rosenbaum,
Sung-Mo Kang:
iTEM: a temperature-dependent electromigration reliability diagnosis tool.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 882-893 (1997) |
| 1996 |
|---|
| 5 | EE | Yi-Kan Cheng,
Chin-Chi Teng,
Abhijit Dharchoudhury,
Elyse Rosenbaum,
Sung-Mo Kang:
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.
DAC 1996: 548-551 |
| 4 | EE | Chin-Chi Teng,
Yi-Kan Cheng,
Elyse Rosenbaum,
Sung-Mo Kang:
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.
DAC 1996: 752-757 |
| 3 | EE | Li-Pen Yuan,
Chin-Chi Teng,
Sung-Mo Kang:
Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques.
ISLPED 1996: 73-78 |
| 1995 |
|---|
| 2 | EE | Chin-Chi Teng,
Anthony M. Hill,
Sung-Mo Kang:
Estimation of maximum transition counts at internal nodes in CMOS VLSI circuits.
ICCAD 1995: 366-370 |
| 1994 |
|---|
| 1 | | Ching-Long Su,
Chin-Chi Teng,
Alvin M. Despain:
A Study of Cache Hashing Functions for Symbolic Applications in Micro-Parallel Processors.
ICPADS 1994: 530-537 |
