Juhong Zhu

List of publications from the DBLP Bibliography Server - FAQ

2003

4 EE Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu: Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium 2003: 184-189

3 EE Magdy S. Abadir, Juhong Zhu: Transition Test Generation using Replicate-and-Reduce Transform for Scan-based Designs. VTS 2003: 22-30

2002

2 EE Li-C. Wang, Magdy S. Abadir, Juhong Zhu: On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC 2002: 398-406

2001

1 EE Magdy S. Abadir, Juhong Zhu, Li-C. Wang: Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS 2001: 252-259

2003
4	EE	Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu: Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium 2003: 184-189
3	EE	Magdy S. Abadir, Juhong Zhu: Transition Test Generation using Replicate-and-Reduce Transform for Scan-based Designs. VTS 2003: 22-30
2002
2	EE	Li-C. Wang, Magdy S. Abadir, Juhong Zhu: On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC 2002: 398-406
2001
1	EE	Magdy S. Abadir, Juhong Zhu, Li-C. Wang: Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS 2001: 252-259

Coauthor Index