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Juhong Zhu

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2003
4EEMagdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu: Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium 2003: 184-189
3EEMagdy S. Abadir, Juhong Zhu: Transition Test Generation using Replicate-and-Reduce Transform for Scan-based Designs. VTS 2003: 22-30
2002
2EELi-C. Wang, Magdy S. Abadir, Juhong Zhu: On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC 2002: 398-406
2001
1EEMagdy S. Abadir, Juhong Zhu, Li-C. Wang: Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS 2001: 252-259

Coauthor Index

1Magdy S. Abadir [1] [2] [3] [4]
2Carol Pyron [4]
3Li-C. Wang [1] [2]
4Jing Zeng [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)