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2003 | ||
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4 | EE | Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu: Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium 2003: 184-189 |
3 | EE | Magdy S. Abadir, Juhong Zhu: Transition Test Generation using Replicate-and-Reduce Transform for Scan-based Designs. VTS 2003: 22-30 |
2002 | ||
2 | EE | Li-C. Wang, Magdy S. Abadir, Juhong Zhu: On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC 2002: 398-406 |
2001 | ||
1 | EE | Magdy S. Abadir, Juhong Zhu, Li-C. Wang: Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS 2001: 252-259 |
1 | Magdy S. Abadir | [1] [2] [3] [4] |
2 | Carol Pyron | [4] |
3 | Li-C. Wang | [1] [2] |
4 | Jing Zeng | [4] |