John Gatej

2002
1	EE	John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns: valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ITC 2002: 1040-1049

Coauthor Index

1	Tom Munns	[1]
2	Carol Pyron	[1]
3	Rajesh Raina	[1]
4	Lee Song	[1]