| |
| 2006 | ||
|---|---|---|
| 1 | EE | Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini: Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability 46(9-11): 1669-1672 (2006) |
| 1 | A. Cester | [1] |
| 2 | Simone Gerardin | [1] |
| 3 | G. Ghidini | [1] |
| 4 | Alessandro Paccagnella | [1] |