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A. Griffoni

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2006
1EESimone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini: Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability 46(9-11): 1669-1672 (2006)

Coauthor Index

1A. Cester [1]
2Simone Gerardin [1]
3G. Ghidini [1]
4Alessandro Paccagnella [1]

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