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F. Rampazzo

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2006
1EEFrancesca Danesin, F. Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006)

Coauthor Index

1Francesca Danesin [1]
2Simone Gerardin [1]
3Gaudenzio Meneghesso [1]
4Alessandro Paccagnella [1]
5F. Zanon [1]
6Enrico Zanoni [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)