| |
| 2006 | ||
|---|---|---|
| 1 | EE | Francesca Danesin, F. Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006) |
| 1 | Francesca Danesin | [1] |
| 2 | Simone Gerardin | [1] |
| 3 | Gaudenzio Meneghesso | [1] |
| 4 | Alessandro Paccagnella | [1] |
| 5 | F. Zanon | [1] |
| 6 | Enrico Zanoni | [1] |