| |
| 2006 | ||
|---|---|---|
| 2 | EE | Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini: Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability 46(9-11): 1669-1672 (2006) |
| 2003 | ||
| 1 | EE | S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini: Ionising radiation effects on MOSFET drain current. Microelectronics Reliability 43(8): 1247-1251 (2003) |
| 1 | S. Cimino | [1] |
| 2 | Simone Gerardin | [2] |
| 3 | G. Ghidini | [1] [2] |
| 4 | A. Griffoni | [2] |
| 5 | Alessandro Paccagnella | [1] [2] |