S. Cimino
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2003
1
EE
S. Cimino,
A. Cester
,
Alessandro Paccagnella
,
G. Ghidini
: Ionising radiation effects on MOSFET drain current.
Microelectronics Reliability 43
(8): 1247-1251 (2003)
Coauthor
Index
1
A. Cester
[
1
]
2
G. Ghidini
[
1
]
3
Alessandro Paccagnella
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
