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Amy Germida

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2000
4 James F. Plusquellic, Amy Germida, Jonathan Hudson, Ernesto Staroswiecki, Chintan Patel: Predicting device performance from pass/fail transient signal analysis data. ITC 2000: 1070-1079
3EEAmy Germida, James F. Plusquellic: Detection of CMOS Defects under Variable Processing Conditions. VTS 2000: 195-204
1999
2EEJames F. Plusquellic, Amy Germida, Zheng Yan: 8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects. DFT 1999: 68-76
1 Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali: Defect detection using power supply transient signal analysis. ITC 1999: 67-76

Coauthor Index

1Jonathan Hudson [4]
2Fidel Muradali [1]
3Chintan Patel [4]
4James F. Plusquellic (Jim Plusquellic) [1] [2] [3] [4]
5Ernesto Staroswiecki [4]
6Zheng Yan [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)