| 1995 |
|---|
| 4 | EE | Fidel Muradali,
Takao Nishida,
Tsuguo Shimizu:
A structure and technique for pseudorandom-based testing of sequential circuits.
J. Electronic Testing 6(1): 107-115 (1995) |
| 1994 |
|---|
| 3 | EE | Takaharu Nagumo,
Masahiko Nagai,
Takao Nishida,
Masayuki Miyoshi,
Shunsuke Miyamoto:
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults.
DAC 1994: 510-515 |
| 1989 |
|---|
| 2 | | Yoichi Tsubuku,
Takao Nishida,
Hiroshi Shiga,
Ken Ohga,
Hirohisa Nishine,
Mamoru Kaneko:
Main Frame Diagnosis Support System.
ITC 1989: 283-289 |
| 1987 |
|---|
| 1 | EE | Takao Nishida,
Shunsuke Miyamoto,
Tokinori Kozawa,
Katsuya Satoh:
RFSIM: Reduced Fault Simulator.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(3): 392-402 (1987) |
