Byung S. So
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1993
1
EE
Byung S. So,
Charles R. Kime
: A fault simulation method: Parallel pattern critical path tracing.
J. Electronic Testing 4
(3): 255-265 (1993)
Coauthor
Index
1
Charles R. Kime
[
1
]
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Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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