Rajiv Sharma
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1988
1
EE
Kewal K. Saluja
, Rajiv Sharma,
Charles R. Kime
: A concurrent testing technique for digital circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 7
(12): 1250-1260 (1988)
Coauthor
Index
1
Charles R. Kime
[
1
]
2
Kewal K. Saluja
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
