| |
| 1986 | ||
|---|---|---|
| 1 | Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear: Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243 | |
| 1 | Anthony P. Ambler | [1] |
| 2 | D. F. Burrows | [1] |
| 3 | I. D. Dear | [1] |
| 4 | W. L. Knight | [1] |