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W. L. Knight

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1986
1 Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear: Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243

Coauthor Index

1Anthony P. Ambler [1]
2D. F. Burrows [1]
3I. D. Dear [1]
4Mark Paraskeva [1]

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