1986 | ||
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1 | Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear: Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243 |
1 | Anthony P. Ambler | [1] |
2 | D. F. Burrows | [1] |
3 | I. D. Dear | [1] |
4 | Mark Paraskeva | [1] |