J. Dick

2003
2	EE	G. Lefranc, B. Weiss, C. Klos, J. Dick, G. Khatibi, H. Berg: Aluminum bond-wire properties after 1 billion mechanical cycles. Microelectronics Reliability 43(9-11): 1833-1838 (2003)
1994
1	EE	I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. Dick: Test strategy planning using economic analysis. J. Electronic Testing 5(2-3): 137-155 (1994)

Coauthor Index

1	Anthony P. Ambler	[1]
2	H. Berg	[2]
3	I. D. Dear	[1]
4	Chryssa Dislis	[1]
5	G. Khatibi	[2]
6	C. Klos	[2]
7	G. Lefranc	[2]
8	B. Weiss	[2]

Colors in the list of coauthors