| |
| 1995 | ||
|---|---|---|
| 5 | O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik: Exact Aliasing Computation for RAM BIST. ITC 1995: 13-22 | |
| 1994 | ||
| 4 | Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi: Aliasing-free Signature Analysis for RAM BIST. ITC 1994: 368-377 | |
| 3 | EE | Michael Nicolaidis, O. Kebichi, Vladimir Castro Alves: Trade-offs in scan path and BIST implementations for RAMs. J. Electronic Testing 5(2-3): 273-283 (1994) |
| 2 | EE | O. Kebichi, Vyacheslav N. Yarmolik, Michael Nicolaidis: Zero aliasing ROM BIST. J. Electronic Testing 5(4): 377-388 (1994) |
| 1992 | ||
| 1 | O. Kebichi, Michael Nicolaidis: A Tool for Automatic Generation of BISTed and Transparent BISTed Rams. ICCD 1992: 570-575 | |
| 1 | Vladimir Castro Alves | [3] |
| 2 | Michael Nicolaidis | [1] [2] [3] [4] [5] |
| 3 | Vyacheslav N. Yarmolik | [2] [4] [5] |