| 2002 |
|---|
| 3 | EE | Sybille Hellebrand,
Hans-Joachim Wunderlich,
Alexander A. Ivaniuk,
Yuri V. Klimets,
Vyacheslav N. Yarmolik:
Efficient Online and Offline Testing of Embedded DRAMs.
IEEE Trans. Computers 51(7): 801-809 (2002) |
| 1999 |
|---|
| 2 | EE | Sybille Hellebrand,
Hans-Joachim Wunderlich,
Alexander A. Ivaniuk,
Yuri V. Klimets,
Vyacheslav N. Yarmolik:
Error Detecting Refreshment for Embedded DRAMs.
VTS 1999: 384-390 |
| 1998 |
|---|
| 1 | EE | Vyacheslav N. Yarmolik,
Yuri V. Klimets,
Serge N. Demidenko:
March PS(23N) Test for DRAM Pattern-Sensitive Faults.
Asian Test Symposium 1998: 354- |
