Percy G. Dias
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1997
1
EE
Shiyi Xu
,
Peter Waignjo
, Percy G. Dias,
Bole Shi
: Testability Prediction for Sequential Circuits Using Neural Network.
Asian Test Symposium 1997
: 48-
Coauthor
Index
1
Baile Shi
(Bole Shi)
[
1
]
2
Peter Waignjo
[
1
]
3
Shiyi Xu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
