Gercy P. Dias
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1995
1
EE
Shiyi Xu
, Gercy P. Dias: Testability forecasting for sequential circuits.
Asian Test Symposium 1995
: 199-205
Coauthor
Index
1
Shiyi Xu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
