Peter Waignjo

List of publications from the DBLP Bibliography Server - FAQ

1997

1 EE Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi: Testability Prediction for Sequential Circuits Using Neural Network. Asian Test Symposium 1997: 48-

1997
1	EE	Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi: Testability Prediction for Sequential Circuits Using Neural Network. Asian Test Symposium 1997: 48-

Coauthor Index