1999 | ||
---|---|---|
4 | EE | Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich: Analog testing by characteristic observation inference. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1353-1368 (1999) |
1998 | ||
3 | EE | Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb: Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. DATE 1998: 822- |
1996 | ||
2 | EE | Walter M. Lindermeir: Design of robust test criteria in analog testing. ICCAD 1996: 604-611 |
1995 | ||
1 | EE | Walter M. Lindermeir, Helmut E. Graeb, Kurt Antreich: Design based analog testing by Characteristic Observation Inference. ICCAD 1995: 620-626 |
1 | Kurt Antreich | [1] [4] |
2 | Helmut E. Graeb | [1] [3] [4] |
3 | Thomas J. Vogels | [3] |