John Ridley
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2002
1
EE
Achintya Halder
,
Abhijit Chatterjee
,
Pramodchandran N. Variyam
, John Ridley: Measuring Stray Capacitance on Tester Hardware.
VTS 2002
: 351-356
Coauthor
Index
1
Abhijit Chatterjee
[
1
]
2
Achintya Halder
[
1
]
3
Pramodchandran N. Variyam
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
