Rajeev R. Rao

2007
13	EE	Rajeev R. Rao, Kaviraj Chopra, David T. Blaauw, Dennis Sylvester: Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors. IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 468-479 (2007)
2006
12	EE	Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Dennis Sylvester: An efficient static algorithm for computing the soft error rates of combinational circuits. DATE 2006: 164-169
11	EE	Rajeev R. Rao, David Blaauw, Dennis Sylvester: Soft error reduction in combinational logic using gate resizing and flipflop selection. ICCAD 2006: 502-509
10	EE	Vivek Joshi, Rajeev R. Rao, David Blaauw, Dennis Sylvester: Logic SER Reduction through Flipflop Redesign. ISQED 2006: 611-616
9	EE	Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester: Analytical yield prediction considering leakage/performance correlation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(9): 1685-1695 (2006)
2005
8	EE	Rajeev R. Rao, David Blaauw, Dennis Sylvester, Charles J. Alpert, Sani R. Nassif: An efficient surface-based low-power buffer insertion algorithm. ISPD 2005: 86-93
7	EE	Rajeev R. Rao, David Blaauw, Dennis Sylvester, Anirudh Devgan: Modeling and Analysis of Parametric Yield under Power and Performance Constraints. IEEE Design & Test of Computers 22(4): 376-385 (2005)
6	EE	Rajeev R. Rao, Harmander Deogun, David Blaauw, Dennis Sylvester: Bus encoding for total power reduction using a leakage-aware buffer configuration. IEEE Trans. VLSI Syst. 13(12): 1376-1383 (2005)
2004
5	EE	Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester: Parametric yield estimation considering leakage variability. DAC 2004: 442-447
4	EE	Harmander Deogun, Rajeev R. Rao, Dennis Sylvester, David Blaauw: Leakage-and crosstalk-aware bus encoding for total power reduction. DAC 2004: 779-782
3		Rajeev R. Rao, Ashish Srivastava, David Blaauw, Dennis Sylvester: Statistical analysis of subthreshold leakage current for VLSI circuits. IEEE Trans. VLSI Syst. 12(2): 131-139 (2004)
2003
2	EE	Rajeev R. Rao, Ashish Srivastava, David Blaauw, Dennis Sylvester: Statistical estimation of leakage current considering inter- and intra-die process variation. ISLPED 2003: 84-89
1	EE	Dan Ernst, Nam Sung Kim, Shidhartha Das, Sanjay Pant, Rajeev R. Rao, Toan Pham, Conrad H. Ziesler, David Blaauw, Todd M. Austin, Krisztián Flautner, Trevor N. Mudge: Razor: A Low-Power Pipeline Based on Circuit-Level Timing Speculation. MICRO 2003: 7-18

Coauthor Index

1	Charles J. Alpert	[8]
2	Todd M. Austin	[1]
3	David Blaauw (David T. Blaauw)	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
4	Kaviraj Chopra	[12] [13]
5	Shidhartha Das	[1]
6	Harmander Deogun	[4] [6]
7	Anirudh Devgan	[5] [7] [9]
8	Dan Ernst	[1]
9	Krisztián Flautner	[1]
10	Vivek Joshi	[10]
11	Nam Sung Kim	[1]
12	Trevor N. Mudge	[1]
13	Sani R. Nassif	[8]
14	Sanjay Pant	[1]
15	Toan Pham	[1]
16	Ashish Srivastava	[2] [3]
17	Dennis Sylvester	[2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
18	Conrad H. Ziesler	[1]