| 2007 |
|---|
| 10 | EE | Subarna Sinha,
Jianfeng Luo,
Charles Chiang:
Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process.
ASP-DAC 2007: 1-6 |
| 9 | EE | Subarna Sinha,
Charles Chiang:
A methodology for fast and accurate yield factor estimation during global routing.
ICCAD 2007: 481-487 |
| 8 | EE | Jingyu Xu,
Subarna Sinha,
Charles Chiang:
Accurate detection for process-hotspots with vias and incomplete specification.
ICCAD 2007: 839-846 |
| 7 | EE | Subarna Sinha,
Qing Su,
Linni Wen,
Frank Lee,
Charles Chiang,
Yi-Kan Cheng,
Jin-Lien Lin,
Yu-Chyi Harn:
A New Flexible Algorithm for Random Yield Improvement.
ISQED 2007: 795-800 |
| 6 | EE | Charles Chiang,
Andrew B. Kahng,
Subarna Sinha,
Xu Xu,
Alexander Zelikovsky:
Bright-Field AAPSM Conflict Detection and Correction
CoRR abs/0710.4661: (2007) |
| 5 | EE | Charles Chiang,
Andrew B. Kahng,
Subarna Sinha,
Xu Xu,
Alexander Zelikovsky:
Fast and Efficient Bright-Field AAPSM Conflict Detection and Correction.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(1): 115-126 (2007) |
| 2006 |
|---|
| 4 | EE | Jianfeng Luo,
Subarna Sinha,
Qing Su,
Jamil Kawa,
Charles Chiang:
An IC manufacturing yield model considering intra-die variations.
DAC 2006: 749-754 |
| 3 | EE | Hailong Yao,
Subarna Sinha,
Charles Chiang,
Xianlong Hong,
Yici Cai:
Efficient process-hotspot detection using range pattern matching.
ICCAD 2006: 625-632 |
| 2005 |
|---|
| 2 | EE | Charles Chiang,
Andrew B. Kahng,
Subarna Sinha,
Xu Xu,
Alexander Zelikovsky:
Bright-Field AAPSM Conflict Detection and Correction.
DATE 2005: 908-913 |
| 1 | | Charles Chiang,
Andrew B. Kahng,
Subarna Sinha,
Xu Xu:
Fast and efficient phase conflict detection and correction in standard-cell layouts.
ICCAD 2005: 149-156 |
