Phil Noto
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1992
1
Bernd Könemann
, Phil Noto: A Test Generation Methodology for High-Performance Computer Chips and Modules.
ITC 1992
: 826-833
Coauthor
Index
1
Bernd Könemann
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
