2005 |
5 | EE | Vivek Chickermane,
Brion L. Keller,
Kevin McCauley,
Anis Uzzaman:
Practical Aspects of Delay Testing for Nanometer Chips.
Asian Test Symposium 2005: 470 |
2004 |
4 | EE | Pamela S. Gillis,
Francis Woytowich,
Andrew Ferko,
Kevin McCauley:
Low Overhead Delay Testing of ASICS.
ITC 2004: 534-542 |
1998 |
3 | EE | Brion L. Keller,
Kevin McCauley,
Joseph Swenton,
James Youngs:
ATPG in practical and non-traditional applications.
ITC 1998: 632-640 |
2 | EE | Pamela S. Gillis,
Francis Woytowich,
Kevin McCauley,
Ulrich Baur:
Delay test of chip I/Os using LSSD boundary scan.
ITC 1998: 83-90 |
1992 |
1 | | Bernd Könemann,
J. Barlow,
Paul Chang,
R. Gabrielson,
C. Goertz,
Brion L. Keller,
Kevin McCauley,
J. Tischer,
Vijay S. Iyengar,
Barry K. Rosen,
T. Williams:
Delay Test: The Next Frontier for LSSD Test Systems.
ITC 1992: 578-587 |