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Kevin McCauley

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2005
5EEVivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman: Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium 2005: 470
2004
4EEPamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley: Low Overhead Delay Testing of ASICS. ITC 2004: 534-542
1998
3EEBrion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs: ATPG in practical and non-traditional applications. ITC 1998: 632-640
2EEPamela S. Gillis, Francis Woytowich, Kevin McCauley, Ulrich Baur: Delay test of chip I/Os using LSSD boundary scan. ITC 1998: 83-90
1992
1 Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams: Delay Test: The Next Frontier for LSSD Test Systems. ITC 1992: 578-587

Coauthor Index

1J. Barlow [1]
2Ulrich Baur [2]
3Paul Chang [1]
4Vivek Chickermane [5]
5Andrew Ferko [4]
6R. Gabrielson [1]
7Pamela S. Gillis [2] [4]
8C. Goertz [1]
9Vijay S. Iyengar [1]
10Brion L. Keller [1] [3] [5]
11Bernd Könemann [1]
12Barry K. Rosen [1]
13Joseph Swenton [3]
14J. Tischer [1]
15Anis Uzzaman [5]
16T. Williams [1]
17Francis Woytowich [2] [4]
18James Youngs [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)