| 2009 |
|---|
| 10 | EE | Jung Hwan Choi,
Nilanjan Banerjee,
Kaushik Roy:
Variation-Aware Low-Power Synthesis Methodology for Fixed-Point FIR Filters.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(1): 87-97 (2009) |
| 2008 |
|---|
| 9 | EE | Swaroop Ghosh,
Jung Hwan Choi,
Patrick Ndai,
Kaushik Roy:
O2C: occasional two-cycle operations for dynamic thermal management in high performance in-order microprocessors.
ISLPED 2008: 189-192 |
| 8 | EE | Animesh Datta,
Swarup Bhunia,
Jung Hwan Choi,
Saibal Mukhopadhyay,
Kaushik Roy:
Profit Aware Circuit Design Under Process Variations Considering Speed Binning.
IEEE Trans. VLSI Syst. 16(7): 806-815 (2008) |
| 2007 |
|---|
| 7 | EE | Jung Hwan Choi,
Jayathi Murthy,
Kaushik Roy:
The effect of process variation on device temperature in FinFET circuits.
ICCAD 2007: 747-751 |
| 6 | EE | Nilanjan Banerjee,
Jung Hwan Choi,
Kaushik Roy:
A process variation aware low power synthesis methodology for fixed-point FIR filters.
ISLPED 2007: 147-152 |
| 5 | EE | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2059-2068 (2007) |
| 2006 |
|---|
| 4 | EE | Aditya Bansal,
Mesut Meterelliyoz,
Siddharth Singh,
Jung Hwan Choi,
Jayathi Murthy,
Kaushik Roy:
Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology.
ASP-DAC 2006: 237-242 |
| 3 | EE | Animesh Datta,
Swarup Bhunia,
Jung Hwan Choi,
Saibal Mukhopadhyay,
Kaushik Roy:
Speed binning aware design methodology to improve profit under parameter variations.
ASP-DAC 2006: 712-717 |
| 2 | EE | Jongsun Park,
Jung Hwan Choi,
Kaushik Roy:
Dynamic bit-width adaptation in DCT: image quality versus computation energy trade-off.
DATE 2006: 520-521 |
| 1 | EE | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits.
ICCAD 2006: 583-586 |
