dblp.uni-trier.dewww.uni-trier.de

M. Fadlallah

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2005
4EEC. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel: Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectronics Reliability 45(3-4): 479-485 (2005)
2003
3EEM. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003)
2002
2EEM. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002)
2001
1 M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1M. Bidaud [3]
2B. Cretu [1]
3T. Devoivre [1]
4G. Ghibaudo [1] [2] [3]
5C. Giannakopoulos [1]
6G. Guégan [2]
7F. Guyader [3]
8J. Jomaah [1] [2]
9T. Maurel [4]
10A. Meinertzhagen [3] [4]
11F. Monsieur [1]
12C. Petit [3] [4]
13O. Simonetti [3] [4]
14A. Szewczyk [1]
15D. Zander [4]
16M. Zoaeter [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)